Device Characterizations-School of Microelectronics,Shandong University

Facilities

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2020-08-031.High Frequency Test System
2020-08-032.DC Test System
2020-08-033.fA-Level Test System for Parameters of Semiconductors
2020-08-034.Low Temperature Strong Magnetic Field Probe Station
2020-08-035.Scanning Electron Microscope（SEM）
2020-08-036.Micro-Raman Spectroscopy System
2020-08-037.Optical Analysis and Solar Test System
2020-08-038.UV-Visible Spectrophotometer
2020-08-039.Low Temperature Test System
2020-08-0310.PDL base station digital broadcasting station
2020-08-0311.Oscilloscope

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